Manufacturing and research

    This range of non-contact optical metrology tools (non contact measurement system) includes the CCI HD, CCI MP and CCI MP-HS. These versatile instruments ideally suit the manufacturing and research industries, where high precision 3D profile analysis is required. 


    Ideal for the optics industry, the CCI Optics non contact measurement system offers a unique thin film measurement capability making it an ideal metrology instrument. Its versatility allows detailed analysis of a range of surfaces, from very rough to extremely smooth. 


      Offering ultra-precise non-contact distance measurement for highest demand in industrial fabrication, quality control and sientific research. The core technology is the multiwavelength interferometry (MWLI®) uniquely offered by Luphos.